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Aquisição de 1 (um) sistema de microscopia duplo de Feixe de Iões Focalizado (FIB) acoplado a Microscópio Eletrónico de Varrimento por emissão de campo (FEG-SEM) para o Laboratório Associado CICECO – Instituto de Materiais de Aveiro

Universidade de Aveiro·Aveiro, Portugal·EUR 600k·Deadline Jun 28, 2026 · 4 days left·Open·Supplies
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Structured notice only
Original notice title

Aquisição de 1 (um) sistema de microscopia duplo de Feixe de Iões Focalizado (FIB) acoplado a Microscópio Eletrónico de Varrimento por emissão de campo (FEG-SEM) para o Laboratório Associado CICECO – Instituto de Materiais de Aveiro

60/100

Opportunity Score

Needs reviewMedium complexity
SuppliesOpen
Why this score?

Opportunity

60 / 100

Complexity

50 / 100

Risk factors

Critical procurement documents (technical specifications, contract terms) were not provided or analyzed. This may hide...

Selection criteria (financial standing, technical capacity, references) are not disclosed. Bidders may be disqualified...

Submission deadline in 4 days

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Overview

Moderate opportunity

Key Facts

  • EUR 600k estimated value
  • Supplies contract
  • 1 lot
  • Duration 180 DAY
  • Supply and delivery of one dual-beam scanning electron microscope (FIB-FEG-SEM) system.
  • System must be installed at the CICECO Associated Laboratory in União das Freguesias de Glória e Vera Cruz, Aveiro, Portugal.
Show full summary

This tender from Universidade de Aveiro (Portugal) seeks the acquisition of one dual-beam scanning electron microscope (FIB-FEG-SEM) for the CICECO Associated Laboratory. It is an open procedure for supplies with a single lot, estimated value €600,000, and a 30-day submission deadline. Only the TED XML notice is available; no procurement documents were analyzed.

Risks

Critical procurement documents (technical specifications, contract terms) were not provided or analyzed. This may hide...

Selection criteria (financial standing, technical capacity, references) are not disclosed. Bidders may be disqualified...

Submission deadline in 4 days

Analysis may be incomplete

Only part of the procurement documentation was analyzed. Additional eligibility requirements, certificates, or submission documents may exist in the remaining tender documentation.

Key Requirements

Technical

  • System must be a dual-beam FIB (Focused Ion Beam) coupled with a FEG-SEM (Field Emission Gun Scanning Electron Microscope).

Administrative

  • Tenders must be submitted electronically via the platform Open portal
  • Submission language: Portuguese (POR).

Requirements may be incomplete.

Award Criteria

Lot 1

Preço — 60%

Buyer

Name

Universidade de Aveiro

Location

Aveiro, PRT

Website

www.ua.pt/

Identifier

501461108

Lots (1)

LOT-0000

Aquisição de 1 (um) sistema de microscopia duplo de Feixe de Iões Focalizado (FIB) acoplado a Microscópio Eletrónico de Varrimento por emissão de campo (FEG-SEM) para o Laboratório Associado CICECO – Instituto de Materiais de Aveiro

Acquisition of one dual-beam FIB-FEG-SEM system for microscopy at CICECO, University of Aveiro.

SuppliesEU fundedElectronic submissionSME suitable

EUR 600k

Estimated value

Location

União das Freguesias de Glória e Vera Cruz, Portugal

Duration

180 DAY

Category

Scanning electron microscopes

Selection criteria

Price

Deadline

Deadline Jun 28, 2026

Procurement Details

Publication date
28 May 2026
Notice type
Contract notice — standard
Languages
Portuguese

Reference metadata

Notice subtype
16
Notice version
2
Legal basis
32014L0024

Reference IDs

Tender ID
370327-2026
Source notice ID
9f49f299-0169-48bf-a442-5161fa3f6f9d

Documents (2)

Procurement document 1Submission portal 1

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