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Kauf, Lieferung und Installation eines Röntgenphotoelektronenspektrometers

Leibniz-Institut für Oberflächenmodifizierung e.V.·Leipzig, Germany·Expired · Jun 08, 2026·Restricted·Supplies
65/100

Opportunity Score

Needs reviewHigh complexity
SuppliesExpired
Why this score?

Opportunity

65 / 100

Complexity

85 / 100

Risk factors

The PIN suggests a tight delivery schedule (contract end by 31 Dec 2026). Any delays in the subsequent tender process m...

Extremely detailed technical specifications (e.g., specific analyzer radius, detector linearity, charge compensation de...

Restricted procedure — pre-qualification required

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Overview

Moderate opportunity

Key Facts

  • Supplies contract
  • 1 lot
  • Duration until Dec 2026
  • Design, manufacture, and delivery of a new XPS system
  • Installation, setup, and commissioning at IOM Leipzig
Show full summary

This is a prior information notice (PIN) for the purchase, delivery, and installation of a new X-ray Photoelectron Spectrometer (XPS) system for Leibniz Institute of Surface Modification (IOM) in Leipzig, Germany. The tender is a restricted procedure (single lot) with highly detailed technical specifications covering the spectrometer, sources, sample handling, software, and peripherals. The estimated contract value is not disclosed. The submission deadline for expressions of interest is 2026-06-08 12:00 (CEST). Award criteria are 50% technical quality and 50% price. No selection criteria or required documents are specified in the notice. The notice is in German only.

Risks

The PIN suggests a tight delivery schedule (contract end by 31 Dec 2026). Any delays in the subsequent tender process m...

Extremely detailed technical specifications (e.g., specific analyzer radius, detector linearity, charge compensation de...

Restricted procedure — pre-qualification required

Analysis may be incomplete

Only part of the procurement documentation was analyzed. Additional eligibility requirements, certificates, or submission documents may exist in the remaining tender documentation.

Key Requirements

Technical

  • Micro-focused monochromatic Al Kα X-ray source with adjustable spot size (10-400 µm), max power ≥120 W at 400 µm
  • Double-focusing 180° hemispherical analyzer with radius ≥125 mm
  • Position-sensitive detector with ≥128 channels and linearity up to 6.5 Mcps

Award Criteria

Lot 1

Technische Eigenschaften

Lot 2

Price criterion

Buyer

Name

Leibniz-Institut für Oberflächenmodifizierung e.V.

Location

Leipzig, DEU

Identifier

03412353302

Lots (1)

LOT-0000

Kauf, Lieferung und Installation eines Röntgenphotoelektronenspektrometers

Supply of a complete new XPS system meeting extensive technical specifications including a micro-focused monochromatic Al Kα X-ray source, double-focusing hemispherical analyzer, multiple analysis modes (mapping, snapshot, imaging), charge compensation, UPS, ISS, REELS, depth profiling with cluster ion source and fs-laser ablation, automated sample stage, vacuum transfer module, and comprehensive software for automation and data analysis. Also includes installation, training, remote service, and spare parts within 3 days in Europe.

SuppliesElectronic submission

Category

Spectrometers

Deadline

Expired Jun 08, 2026

Procurement Details

Publication date
04 May 2026
Notice type
Prior information notice — call for competition
Languages
German

Reference metadata

Notice subtype
10
Notice version
1
Legal basis
32014L0024

Reference IDs

Tender ID
305374-2026
Source notice ID
c782adc2-dd57-4d80-bbeb-c43eb9c70267

Documents (1)

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