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FIB and SEM system for HHI

Fraunhofer-Gesellschaft - Einkauf B12·München, Germany·Deadline Jul 24, 2026 · 27 days left·Neg W Call·Supplies
Original notice title

Germany – Miscellaneous general and special-purpose machinery – FIB & SEM system (HHI-01) - PR1216644-3220-P

0/100

Opportunity Score

High riskLow complexity
SuppliesOpen
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Opportunity

0 / 100

Complexity

0 / 100

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Award Criteria

Lot 1

technical specification50%

Buyer

Name

Fraunhofer-Gesellschaft - Einkauf B12

Location

München, DEU

Buyer profile

Open profile

Identifier

DE 129515865

Lots (1)

LOT-0000

FIB & SEM system (HHI-01) - PR1216644-3220-P

1 FIB-SEM dual-beam system As part of the procurement process, a field-free (without immersion optics) focused ion beam system (FIB-SEM) combined with a high-resolution scanning electron microscope (SEM) is to be selected. The system will be used for patterning, nanostructuring, and cross-sectional and surface analysis of primarily III/V semiconductors, LNOI, polymers and resists, as well as process products typical of semiconductor technology. Programmable and automated routines should be configurable where possible. Options - Advanced training course for 15 days (2 people); availability to be confirmed as required - 1 gas injection system with additional components; to be specified in the tender - Software module for importing KLAF files

SuppliesEU fundedElectronic submissionSME suitable

Location

Berlin, Germany

Duration

12 MONTH

Category

Special-purpose machinery

Selection criteria

Quality

Procurement Details

Publication date
24 Jun 2026
Notice type
Contract notice — standard
Languages
German, English

Reference metadata

Notice subtype
16
Notice version
1
Legal basis
32014L0024

Reference IDs

Tender ID
435079-2026

Documents (2)

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