PFIB-SEM microscope system
Original notice title
WAFER-CAPABLE PLASMA FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPE (PFIB-SEM) SYSTEM
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Complexity
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Submission deadline in 12 days
Deep Portfolio Analysis
Uses:
- Description
- Industries & Services
- Capabilities
- Market & Experience
- Certifications
Buyer
Name
Imec EU Pilot line NV
Location
Heverlee, BEL
Buyer profile
Identifier
1004987603_21101
Lots (1)
LOT-0001
JPA2026ID76 - 1
WAFER-CAPABLE PLASMA FOCUSED ION BEAM SCANNING ELECTRON MICROSCOPE (PFIB-SEM) SYSTEM
Location
Category
Award details
Procurement Details
- Publication date
- 03 Jun 2026
- Notice type
- Contract notice — standard
- Languages
- Dutch, English
Reference metadata
- Notice subtype
- 16
- Notice version
- 1
- Legal basis
- 32014L0024
Reference IDs
- Tender ID
- 382478-2026
- Source notice ID
- cd4c2654-b78a-45b8-b3fa-33f3d60a760a
Documents (2)
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Opportunity Score
Why this score?
Opportunity
0 / 100
Complexity
0 / 100
Risk factors
Submission deadline in 12 days
Deep Portfolio Analysis
Uses:
- Description
- Industries & Services
- Capabilities
- Market & Experience
- Certifications